Thermal parameter extraction technique using DC I-V data for HBT transistors

IEEE High Frequency Postgraduate Student Colloquium

Volumn , Issue , 2000, Pages 71-75

  Williams, David ^a   Tasker, Paul ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; HEAT RESISTANCE; THERMAL EFFECTS;

THERMAL PARAMETER EXTRACTION TECHNIQUE;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0034497875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)