Self-Heating Induced Soft Degradation of the Early Voltage in SiGe:C HBTs

IEEE Electron Device Letters

Volumn 24, Issue 10, 2003, Pages 646-648

  Xu, M W ^a   Sibaja Hernandez, A ^a,b   Sadovnikov, A ^c   Decoutere, S ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Early voltage; Output conductance; Self heating; SiGe:C HBTs; Thermal resistance

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; HEATING; SEMICONDUCTING SILICON COMPOUNDS;

SELF HEATING;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0141918452     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.817384     Document Type: Article

References (6)

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