High lateral resolution imaging with sharpened tip of multi-walled carbon nanotube scanning probe

Journal of Physical Chemistry B

Volumn 108, Issue 9, 2004, Pages 2816-2821

  Nguyen, Cattien V ^a,b   So, Chris ^a,b   Stevens, Ramsey M ^a,b   Li, You ^a,b   Delziet, Lance ^a   Sarrazin, Philippe ^a   Meyyappan, M ^a  

^a NASA AMES RESEARCH CENTER   (United States)

^b ELORET CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; IMAGING TECHNIQUES; OXIDATION; SCANNING;

HIGH LATERAL RESOLUTION IMAGING; MULTIWALLED CARBON NANOTUBE; SCANNING PROBE;

CARBON NANOTUBES;

EID: 1542276579     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0361529     Document Type: Article

References (21)

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21. As an example, a multiwalled CNT probe with a length of about 1 μm and a cantilever with a free amplitude set a 1 V (∼15 nm amplitude for a etched silicon probe with 2-5 nN/nm force constant) a range of set point from 0.8 to 0.4 V may be used for imaging without any problem in feed-back control.