Dimensional metrology of nanometric spherical particles using AFM: I, model development

Probe Microscopy

Volumn 1, Issue 1, 1997, Pages 107-116

  Garcia, V J ^a   Martinez, L ^a   Briceno Valero, J M ^a   Schilling, C H ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

Atomic Force Microscopy; Broadening Effect; Tapping Mode; Tip Calibration

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; GEOMETRY; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; SIMULATION;

EID: 0031544040     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (31)