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Volumn 43, Issue 12, 2004, Pages 7960-7965

Effects of chamber wall heating and quartz window on fast deposition of microcrystalline silicon films by high-density microwave plasma

Author keywords

Chamber wall heating; Fast deposition; High density microwave plasma; Microcrystalline silicon; Oxygen impurity

Indexed keywords

MICROWAVES; PLASMA DENSITY; PLASMA DEVICES; SURFACE WAVES; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 13644280605     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.7960     Document Type: Article
Times cited : (4)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.