Fast characterisation of InAs quantum dot structures using AFM

Journal of Crystal Growth

Volumn 264, Issue 1-3, 2004, Pages 26-30

  Basnar, B ^a   Hirner, H ^a   Gornik, E ^a   Strasser, G ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

A1. Atomic force microscopy; B2. Semiconducting III V materials; B3. Quantum dot devices

Indexed keywords

AMINES; ATOMIC FORCE MICROSCOPY; ETCHING; FRACTURE; SELF ASSEMBLY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; STRAIN; SURFACE TOPOGRAPHY;

CROSS-SECTIONAL WAFER MAPPING; QUANTUM DOT DEVICES; SEMICONDUCTING III-V MATERIALS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 1342264151     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.12.026     Document Type: Article

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