Nucleation and growth of self-assembled Ge/Si (001) quantum dots in single and stacked layers

Thin Solid Films

Volumn 380, Issue 1-2, 2000, Pages 2-9

  Thanh, Vinh Le ^a   Yam, V ^a   Zheng, Y ^b   Bouchier, D ^a  

^a UNIV PARIS SUD   (France)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; NUCLEATION; OPTICAL CORRELATION; PHOTOLUMINESCENCE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY;

PHOTOLUMINESCENCE SPECTROSCOPY;

SEMICONDUCTING FILMS;

EID: 0003085729     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01459-0     Document Type: Article

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