Atomic-force-microscopy visualization of GeSi buried nanoislands on crystal cleavages in silicon structures

Semiconductors

Volumn 37, Issue 6, 2003, Pages 667-674

  Dunaevskii M S ^a   Krasil'nik, Z F ^b   Lobanov, D N ^b   Novikov, A V ^b   Titkov, A N ^a   Laiho, R ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^c UNIVERSITY OF TURKU   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038496803     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1582533     Document Type: Article

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