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Volumn , Issue , 2002, Pages 478-485

Test planning and design space exploration in a core-based environment

Author keywords

[No Author keywords available]

Indexed keywords

COMPREHENSIVE MODEL; DESIGN SPACES; OPTIMIZATION FACTORS; SYSTEM TEST; TEST PLANNING; TEST TIME;

EID: 13244293459     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998316     Document Type: Conference Paper
Times cited : (23)

References (21)
  • 1
    • 0031361926 scopus 로고    scopus 로고
    • An IEEE 1149.1 based test access architecture for ICs with embedded cores
    • November
    • L. Whetsel. An IEEE 1149.1 Based Test Access Architecture for ICs with Embedded Cores. In International Test Conference, pages 69-78, November 1997.
    • (1997) International Test Conference , pp. 69-78
    • Whetsel, L.1
  • 2
    • 0032310132 scopus 로고    scopus 로고
    • Hierarchical Test Access Architecture for Embedded Cores in an Integrated Circuit
    • April
    • D. Bhattacharya. Hierarchical Test Access Architecture for Embedded Cores in an Integrated Circuit. In 16th IEEE VLSI Test Symposium, pages 8-14, April 1998.
    • (1998) 16th IEEE VLSI Test Symposium , pp. 8-14
    • Bhattacharya, D.1
  • 3
    • 0032308284 scopus 로고    scopus 로고
    • A structured test re-use methodology for core-based system chips
    • October
    • P. Varma and S. Bhatia. A Structured Test Re-use Methodology for Core-based System Chips. In International Test Conference, pages 294-302, October 1998.
    • (1998) International Test Conference , pp. 294-302
    • Varma, P.1    Bhatia, S.2
  • 5
  • 6
    • 0031354471 scopus 로고    scopus 로고
    • A low overhead design for testability and test generation technique for core-based systems
    • November
    • I. Ghosh, N. Jha, and S. Dey. A Low Overhead Design for Testability and Test Generation Technique for Core-based Systems. In International Test Conference, pages 50-59, November 1997.
    • (1997) International Test Conference , pp. 50-59
    • Ghosh, I.1    Jha, N.2    Dey, S.3
  • 9
    • 0032314038 scopus 로고    scopus 로고
    • Scan chain design for test time reduction in core-based ICs
    • October
    • J. Aerts and E. Marinissen. Scan Chain Design for Test Time Reduction in Core-based ICs. In International Test Conference, pages 448-457, October 1998.
    • (1998) International Test Conference , pp. 448-457
    • Aerts, J.1    Marinissen, E.2
  • 10
    • 84893689452 scopus 로고    scopus 로고
    • Analysis and minimization of test time in a combined BIST and external test approach
    • March
    • M. Sugihara, H. Date, and H. Yasuura. Analysis and Minimization of Test Time in a Combined BIST and External Test Approach. In Design, Automation and Test in Europe Conference, pages 134-140, March 2000.
    • (2000) Design, Automation and Test in Europe Conference , pp. 134-140
    • Sugihara, M.1    Date, H.2    Yasuura, H.3
  • 11
    • 0033740887 scopus 로고    scopus 로고
    • Design of system-on-a-chip test access architectures using integer linear programming
    • May
    • K. Chakrabarty. Design of System-on-a-chip Test Access Architectures Using Integer Linear Programming. In 18th IEEE VLSI Test Symposium, pages 127-134, May 2000.
    • (2000) 18th IEEE VLSI Test Symposium , pp. 127-134
    • Chakrabarty, K.1
  • 12
    • 0034483643 scopus 로고    scopus 로고
    • An ILP formulation to optimize test access mechanism in system-on-chip testing
    • October
    • M. Nourani and C. Papachristou. An ILP Formulation to Optimize Test Access Mechanism in System-on-chip Testing. In International Test Conference, pages 902-910, October 2000.
    • (2000) International Test Conference , pp. 902-910
    • Nourani, M.1    Papachristou, C.2
  • 20
    • 0035680777 scopus 로고    scopus 로고
    • Iterative test wrapper and test access mechanism co-optimization
    • October
    • V. Iyengar, K. Chakrabarty, and E. J. Marinissen. Iterative Test Wrapper and Test Access Mechanism Co-optimization. In International Test Conference, pages 1023-1032, October 2001.
    • (2001) International Test Conference , pp. 1023-1032
    • Iyengar, V.1    Chakrabarty, K.2    Marinissen, E.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.