RTL Test Justification and Propagation Analysis for Modular Designs

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 13, Issue 2, 1998, Pages 105-120

  Makris, Yiorgos ^a,b,c   Orailoǧlu, Alex ^a,d,e  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF PATRAS   (Greece)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d HARVARD COLLEGE   (United States)

^e UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

DFT; Modular design; RTL testability analysis; Test justification; Test propagation

Indexed keywords

ALGORITHMS; CONTROLLABILITY; INSERTION LOSSES; OBSERVABILITY;

REGISTER-TRANSFER LEVEL (RTL) TESTABILITY ANALYSIS;

DESIGN FOR TESTABILITY;

EID: 0032183485     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008301720070     Document Type: Article

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