Analysis and minimization of test time in a combined BIST and external test approach

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 134-140

  Sugihara, Makoto ^a   Date, Hiroshi ^b   Yasuura, Hiroto ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b Institute of Systems & Information Technologies/KYUSHU   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION TIME; DESIGN TIME; OPTIMUM TEST SETS; TEST TIME; TESTING TIME;

ALGORITHMS; DESIGN; EXHIBITIONS;

TESTING;

EID: 84893689452     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840029     Document Type: Conference Paper

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