Scanning probe lithography of self-assembled monolayers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5220, Issue , 2003, Pages 52-65

  Yang, Guohua ^a   Amro, Nabil A ^a   Liu, Gang Yu ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Atomic force microscopy; Nanofabrication; Scanning probe lithography; Scanning tunneling microscopy; Self assembled monolayers; Thiol

Indexed keywords

ATOMIC FORCE MICROSCOPY; DESORPTION; ELECTRIC FIELD EFFECTS; MOLECULAR STRUCTURE; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY;

NANOGRAFTING; SCANNING PROBE LITHOGRAPHY; THIOL;

SELF ASSEMBLY;

EID: 1242331012     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.504613     Document Type: Conference Paper

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