Local pH-controlled reactivity investigations by thin-layer scanning tunnelling microscopy

Electrochimica Acta

Volumn 47, Issue 1, 2001, Pages 327-334

  Ammann, E ^a,d   Beuret, C ^b   Indermuhle P F ^b,e   Kotz R ^c   De Rooij, N F ^b   Siegenthaler, H ^a  

^a UNIVERSITY OF BERN   (Switzerland)

^b UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^e Zymoyx   (United States)

Author keywords

H+ exchange; Iridium oxide; Polyaniline; STM; Thin layer

Indexed keywords

CONDUCTIVE FILMS; CONDUCTIVE PLASTICS; ELECTRIC POTENTIAL; ELECTROPOLYMERIZATION; HYDROGEN; ION EXCHANGE; IRIDIUM COMPOUNDS; MICROELECTRODES; OXIDATION; PLASTIC FILMS; REDOX REACTIONS; REDUCTION; SCANNING TUNNELING MICROSCOPY; SODIUM COMPOUNDS;

IRIDIUM OXIDE; POLYANILINE;

ELECTROCHEMICAL ELECTRODES;

EID: 0035451297     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(01)00579-5     Document Type: Article

References (6)

1. (a) T.P. Moffat, in: A.J. Bard (Ed.), Electroanalytical Chemistry, vol. 21, Marcel Dekker, New York, 1999, pp. 212-316 (Ch. 3);
2. (b) A.A. Gewirth, B.K. Niece, Chem. Rev. 97 (1997) 1229;
3. H. Siegenthaler, in: R. Wiesendanger, H.J. Güntherodt (Eds.), Scanning Tunneling Microscopy II. In: Springer Series in Surface Science, vol. 20, Springer, Berlin, 1995, pp. 7-49.
4. E. Ammann, PhD Thesis, University of Bern, 1999.
5. P.-F. Indermühle, E. Ammann, P. Häring, R. Kötz, H. Siegenthaler, N.F. de Rooij, Microelectron. Eng. 41/42 (1998) 547.
6. H. Siegenthaler, in: N. Garcia, M. Nieto-Vesperinas, H. Rohrer (Eds.), Nanoscale Science and Technology. In: NATO ASI Series E, vol. 348, Kluwer Academic, Dordrecht, 1998, pp. 297-315.