Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 2233-2239

  Zhou, H ^a   Mills, G ^a   Chong, B K ^a   Midha, A ^a   Donaldson, L ^a   Weaver, J M R ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; DIRECT WRITE; FUNCTIONALIZATIONS; NEAR-FIELD; RECENT PROGRESS;

PROBES;

EID: 0000364793     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581753     Document Type: Conference Paper

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