Complex dynamics in a harmonically excited lennard-jones oscillator: Microcantilever-sample interaction in scanning probe microscopes

Journal of Dynamic Systems, Measurement and Control, Transactions of the ASME

Volumn 122, Issue 1, 2000, Pages 240-245

  Basso, M ^a   Giarre L ^b   Dahleh, M ^c   Mezic I ^c  

^a UNIVERSITY OF FLORENCE   (Italy)

^b UNIVERSITY OF PALERMO   (Italy)

^c Santa Barbara   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012342125     PISSN: 00220434     EISSN: 15289028     Source Type: Journal    
DOI: 10.1115/1.482465     Document Type: Article

References (11)

1. Burnham, N. A., Kulik, A., Gremaud, G., and Briggs, G., 1995, “Nanosubar-monics: The Dynamics of Small Nonlinear Contacts,” Phys. Rev., 74, pp. 5092-5095.
2. Ashhab, M., Salapaka, M., Dahleh, M., and Mezic, I., 1997, “Control of Chaos in Atomic Force Microscopes,” ACC, Albuquerque, NM.
3. Ashhab, M., Salapaka, M. V., Dahleh, M., and Mezic, I., “Melnikov-based Dynamical Analysis of Microcantilevers in Scanning Probe Microscopy,” J. Nonlinear Dynam., 20, pp. 197-220.
4. Israelachvili, J. N., 1985, Intermolecular and Surface Forces, Academic Press, New York.
5. Wiggins, S., 1990, Introduction to Applied Nonlinear Dynamical Systems and Chaos, Springer-Verlag, New York.
6. Nayfeh, A., and Balachandran, B., 1995, Applied Nonlinear Dynamics, Wiley, New York.
7. Osedelec, V. I., 1968, “A Multiplicative Ergodic Theorem: Lyapunov Characteristic Numbers for Dynamical System” Trans. Mosc. Math. Soc., 19, p. 197.
8. Parker, T. S., and Chua, L. O., 1989, Practical Numerical Algorithms for Chaotic Systems, Springer-Verlag, New York.
9. Ott, E., 1993, Chaos in Dynamical Systems, Cambridge University Press, New York.
10. Ruelle, D., 1987, Chaotic Evolution and Strange Attractors, Cambridge University Press, New York.
11. Doedel, E. J., Keller, H. B., and Kernevez, J. P., 1991, “Numerical Analysis and Control of Bifurcation Problems I: Bifurcations in Finite Dimension,” Int. J. Bifurcation Chaos Appl. Sci. Eng., 1, pp. 493-520.