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Journal of Applied Physics

Volumn 69, Issue 2, 1991, Pages 668-673

Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

(4) Albrecht, T R a Grutter P a Horne, D a Rugar, D a

a IBM ALMADEN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038981463 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.347347 Document Type: Article

Times cited : (2157)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.