A comparative study of AlGaAsSb/AlAsSb distributed Bragg mirrors on InP

Superlattices and Microstructures

Volumn 31, Issue 6, 2002, Pages 277-283

  Toginho Filho, D O ^a   Dias, I F L ^a   Duarte, J L ^a   Lourenco S A ^a   Pocas L C ^a   Laureto, E ^a   Harmand, J C ^b  

^a STATE UNIVERSITY OF LONDRINA   (Brazil)

^b Laboratoire CDP   (France)

Author keywords

Bragg mirror; Electrical conductance; Reflectance; Semiconductors

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MIRRORS; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS;

BRAGG MIRRORS; MATERIAL SYSTEMS; MODULATION DOPING; VALENCE BANDS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 10844290976     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.2002.1046     Document Type: Article

References (23)

1. T. Anan, H. Shimomura, and S. Sugou, Electron. Lett. 30, 2138 (1994).
2. M. Sugimoto, H. Kosaka, K. Kurihara, I. Ogura, T. Numai, and K. Kasahara, Electron. Lett. 28, 385 (1992).
3. T. E. Sale (ed.), Vertical Cavity Surface Emitting Lasers (Research Studies Press Ltd, John Wiley & Sons, 1995).
4. M. G. Peters, B. J. Thibeault, D. B. Young, J. W. Scott, F. H. Peters, A. C. Gossard, and L. A. Coldren, Appl. Phys. Lett. 63, 3411 (1993).
5. P. Salet, P. Pagnod-Rossiaux, F. Gaborit, A. Plais, and J. Jacquet, Electron. Lett. 33, 1145 (1997).
6. Y. Ohiso, R. Iga, K. Kishi, and C. Amano, Electron. Lett. 36, 39 (2000).
7. I. F. L. Dias, J. L. Duarte, E. Laureto, R. V. Gelamo, E. A. Menezes, and J. C. Harmand, Superlatt. Microstruct. 28, 29 (2000).
8. G. Almuneau, E. Hall, S. Nakagawa, J. K. Kim, D. Lofgreen, O. Sjolund, C. Luo, D. R. Clarke, J. H. English, and L. A. Coldren, J. Vac. Sci. Technol. B18, 1601 (2000).
9. I. F. L. Dias, B. Nabet, A. Kohl, and J. C. Harmand, Electron. Lett. 33, 716 (1997).
10. I. F. L. Dias, B. Nabet, A. Kohl, J. L. Benchimol, and J. C. Harmand, IEEE Photonics Technol. Lett. 10, 763 (1998).
11. G. Almuneau, E. Hall, T. Mukaihara, S. Nakagawa, C. Y. Luo, D. R. Clarke, and L. A. Coldren, Photonics Technol. Lett. 12, 1322 (2000).
12. F. Genty, G. Almuneau, N. Bertru, L. Chusseau, P. Grech, D. Cot, and J. Jacquet, J. Cryst. Growth 183, 15 (1998).
13. G. Almuneau, E. Hall, S. Mathis, and L. A. Coldren, J. Cryst. Growth 208, 113 (2000).
14. B. Lambert, Y. Toudic, Y. Rouillard, M. Gauneau, M. Baudet, F. Alard, I. Valiente, and J. C. Simon, Appl. Phys. Lell. 66, 442 (1995).
15. O. Blum, I. J. Fritz, L. R. Dawson, A. J. Howard, T. J. Headley, J. F. Klem, and T. J. Drummond, Appl. Phys. Lell. 66, 329 (1995).
16. J. C. Harmand, A. Kohl, H. Juhel, and G. LeRoux, J. Cryst. Growth 175, 372 (1997).
17. J. M. Palmer, The measurements of transmission, absorption, emission, and reflexion, Handbook of Optics Part-II (McGraw-Hill, New York, 1995).
18. O. Blum, I. J. Fritz, L. R. Dawson, and T. J. Drummond, Electron. Lett. 31, 1247 (1995).
19. J. C. Harmand, F. Jeannès, G. Le Roux, and M. Juhel, Electron. Lett. 31, 1689 (1995).
20. J. C. Harmand et al., J. Cryst. Growth 201/202, 837 (2000).
21. E. Hall, S. Nagakawa, G. Almuneau, J. K. Kin, and L. A. Coldren, Electron. Lett. 36, 1465 (2000).
22. S. Nagakawa, E. Hall, G. Almuneau, J. K. Kim, D. A. Buell, H. Kroemer, and L. A. Coldren, IEEE J. Selected Topics Quantum Electron. 7, 224 (2001).
23. D. O. Toginho Filho and I. F. L. Dias (in press).