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Volumn 2, Issue , 2004, Pages 1237-1243

Compliant die-package interconnects at high frequencies

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; INDUCTANCE; INSERTION LOSSES; INTERFACES (MATERIALS); PERMITTIVITY; SOUND INSULATION;

EID: 10444239308     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (15)
  • 1
    • 0141882977 scopus 로고    scopus 로고
    • Design optimization of one-turn helix: A novel compliant off-chip interconnect
    • May
    • Q. Zhu, L. Ma, and S. K. Sitaraman, "Design optimization of one-turn helix: A novel compliant off-chip interconnect," IEEE Trans. Adv. Packag., vol. 26, pp. 106-112, May 2003.
    • (2003) IEEE Trans. Adv. Packag. , vol.26 , pp. 106-112
    • Zhu, Q.1    Ma, L.2    Sitaraman, S.K.3
  • 2
    • 0142165072 scopus 로고    scopus 로고
    • β-helix: A lithography-based compliant off-chip interconnect
    • Sep.
    • Q. Zhu, L. Ma, and S. K. Sitaraman, "β-helix: A lithography-based compliant off-chip interconnect," IEEE Trans. Comp. Packag. Technol., vol. 26, pp. 582-590, Sep. 2003.
    • (2003) IEEE Trans. Comp. Packag. Technol. , vol.26 , pp. 582-590
    • Zhu, Q.1    Ma, L.2    Sitaraman, S.K.3
  • 3
    • 1242286974 scopus 로고    scopus 로고
    • Study of electro-plated compliant G-helix chip-to-substrate interconnects
    • Maui, July 6-11, paper no. 35342 (12 pages)
    • Q. Zhu, L. Ma, and S. K. Sitaraman, "Study of electro-plated compliant G-helix chip-to-substrate interconnects," in Proc. Int. Electron. Packag. Technical Conf. and Exhib. (IPACK), Maui, July 6-11, 2003, paper no. 35342 (12 pages).
    • (2003) Proc. Int. Electron. Packag. Technical Conf. and Exhib. (IPACK)
    • Zhu, Q.1    Ma, L.2    Sitaraman, S.K.3
  • 4
    • 0042386686 scopus 로고    scopus 로고
    • Study of coupled thermal electric behavior of compliant micro-spring interconnects for next generation probing applications
    • June
    • M. Ahmad and S. K. Sitaraman, "Study of coupled thermal electric behavior of compliant micro-spring interconnects for next generation probing applications," IEEE Trans. Comp. Packag. Technol., vol. 26, pp. 407-415, June 2003.
    • (2003) IEEE Trans. Comp. Packag. Technol. , vol.26 , pp. 407-415
    • Ahmad, M.1    Sitaraman, S.K.2
  • 7
    • 0347569194 scopus 로고    scopus 로고
    • Mechanical and preliminary electrical design of a novel compliant one-turn-helix (OTH) interconnect
    • Kauai, July 8-13, paper no. 15664 (6 pages)
    • Q. Zhu, L. Ma, and S. K. Sitaraman, "Mechanical and preliminary electrical design of a novel compliant one-turn-helix (OTH) interconnect," in Proc. Int. Electron. Packag. Technical Conf. and Exhib. (IPACK), Kauai, July 8-13, 2001, paper no. 15664 (6 pages).
    • (2001) Proc. Int. Electron. Packag. Technical Conf. and Exhib. (IPACK)
    • Zhu, Q.1    Ma, L.2    Sitaraman, S.K.3
  • 11
    • 0034828965 scopus 로고    scopus 로고
    • Coupled thermal electric modeling of flexible micro-spring interconnects for high-performance probing
    • Orlando, May 29-June 1
    • M. Ahmad and S. K. Sitaraman, "Coupled thermal electric modeling of flexible micro-spring interconnects for high-performance probing," in Proc. IEEE Electron. Components and Technol. Conf. (ECTC), Orlando, May 29-June 1, 2001, pp. 721-729.
    • (2001) Proc. IEEE Electron. Components and Technol. Conf. (ECTC) , pp. 721-729
    • Ahmad, M.1    Sitaraman, S.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.