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0346221646
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note
-
+ sputtering and annealing before use.
-
-
-
-
18
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-
0347482743
-
-
note
-
-5 for W (measured on the NiAl substrate, using sample voltages of ∼2.3 V). These numbers were obtained by integrating the photon counts over the spectral region from 600 to 1000 nm (where the molecular light emission was usually observed) and dividing the result by the detection efficiency of our system (∼0.1%, as estimated from the properties of our optical components and CCD camera). Our quantum efficiencies are comparable to the published values (10).
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-
-
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19
-
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0346221645
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note
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+ sputtering and annealing at 1300 K.
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26
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27
-
-
0347482702
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-
note
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For positive bias, most of the plasmon excitation events occur close to the metal substrate (39) inside the oxide film, where the plasmon field is expected to be weaker than in vacuum. The weak emission from the oxide can be attributed to inefficient coupling between plasmons and IET current.
-
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28
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0346221586
-
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note
-
In a more accurate analysis, the finite voltage drop in the oxide film and the shift of the molecular orbital energies induced by the bias voltage must both be considered.
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31
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33
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0346221585
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note
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NiAl(λ) are slowly changing functions in the narrow energy region where molecular fluorescence is observed, then the relative intensities of the vibrational peaks on top of the IET background in Fig. 5C must be close to the actual intensities.
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35
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40
-
-
0346221584
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-
note
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We are greatly indebted to N. Nilius and D. L. Mills for insightful discussions. Supported by the Chemical Science, Geo- and Bioscience Division, Office of Science, U.S. Department of Energy, under grant DEFG03-01ER15157.
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