Ionic films on vicinal metal surfaces: enhanced binding due to charge modulation

Physical Review Letters

Volumn 86, Issue 2, 2001, Pages 252-255

  Repp, Jascha ^a   Fölsch, Stefan ^a   Meyer, Gerhard ^a,b   Rieder, Karl Heinz ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BINDING ENERGY; COPPER; DEPOSITION; EPITAXIAL GROWTH; LOW TEMPERATURE PROPERTIES; MONOLAYERS; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY;

CHARGE MODULATION; SMOLUCHOWSKI SMOOTHING EFFECT; SURFACE FACETING;

SODIUM CHLORIDE;

EID: 4243279225     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.252     Document Type: Article

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