Stoichiometry and morphology of MgO films grown reactively on Ag(100)

Applied Surface Science

Volumn 142, Issue 1, 1999, Pages 129-134

  Wollschlager J ^a   Viernow, J ^a   Tegenkamp, C ^a   Erdos D ^a   Schroder K M ^a   Pfnur H ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MAGNESIA; MAGNESIUM; MOLECULAR BEAM EPITAXY; MOLECULAR ORIENTATION; MORPHOLOGY; OXIDATION; SILVER; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

MAGNESIA FILMS; SPOT PROFILE ANALYSIS LOW ENERGY ELECTRON DIFFRACTION;

METALLIC FILMS;

EID: 0037535582     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00656-4     Document Type: Article

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