메뉴 건너뛰기




Volumn 79, Issue 5, 1996, Pages 2352-2363

Species and dose dependence of ion implantation damage induced transient enhanced diffusion

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000398591     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361162     Document Type: Article
Times cited : (72)

References (43)
  • 12
    • 3643092942 scopus 로고
    • Ph.D. thesis, Stanford University
    • P. A. Packan, Ph.D. thesis, Stanford University, 1991.
    • (1991)
    • Packan, P.A.1
  • 14
    • 3643122146 scopus 로고
    • Ph.D. thesis, Stanford University
    • R. Y. S. Huang, Ph.D. thesis, Stanford University, 1994.
    • (1994)
    • Huang, R.Y.S.1
  • 20
    • 3643120074 scopus 로고
    • Ph.D thesis, Stanford University
    • S. W. Crowder, Ph.D thesis, Stanford University, 1995.
    • (1995)
    • Crowder, S.W.1
  • 36
    • 0041978437 scopus 로고
    • edited by J. Narayan and T. Y. Tan North-Holland, Amsterdam
    • S M. Hu, Defects in Semiconductors, edited by J. Narayan and T. Y. Tan (North-Holland, Amsterdam 1981), p. 333.
    • (1981) Defects in Semiconductors , pp. 333
    • Hu, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.