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Volumn 35, Issue 3, 2004, Pages 291-297

Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications

Author keywords

LDMOS; Power amplifier; RF; Silicon on insulator; Silicon on sapphire

Indexed keywords

CARRIER MOBILITY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CRYSTALLOGRAPHY; HEAT RESISTANCE; IONIZATION; LEAKAGE CURRENTS; MOS DEVICES; NUMERICAL METHODS; POWER AMPLIFIERS; Q FACTOR MEASUREMENT; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY; THIN FILMS; TRANSISTORS;

EID: 0742268510     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(03)00187-3     Document Type: Conference Paper
Times cited : (6)

References (21)
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    • Larson L.E. Integrated circuit technology options for RFIC's - present status and future directions. IEEE J. Solid State Circuits. 33:(3):1998;387-398.
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    • Larson, L.E.1
  • 6
    • 0035279648 scopus 로고    scopus 로고
    • An SOI LDMOS/CMOS/BJT technologies for integrated power amplifiers used in wireless tranceiver applications
    • Kumar M., Tan Y., Sin J.K.O., Cai J. An SOI LDMOS/CMOS/BJT technologies for integrated power amplifiers used in wireless tranceiver applications. IEEE Trans. Electron. Devices. 22:(3):2001;136-138.
    • (2001) IEEE Trans. Electron. Devices , vol.22 , Issue.3 , pp. 136-138
    • Kumar, M.1    Tan, Y.2    Sin, J.K.O.3    Cai, J.4
  • 15
    • 0032740062 scopus 로고    scopus 로고
    • Measurement of buried oxide thermal conductivity for accurate electrothermal simulation of SOI devices
    • Tenbroek B.M., et al. Measurement of buried oxide thermal conductivity for accurate electrothermal simulation of SOI devices. IEEE Trans. Electron. Devices. 46:(1):1999;251-253.
    • (1999) IEEE Trans. Electron. Devices , vol.46 , Issue.1 , pp. 251-253
    • Tenbroek, B.M.1
  • 17
    • 36149005932 scopus 로고
    • Thermal conductivity of silicon and germanium from 3 K to the melting point
    • Glassbrenner C.J., Slack G.A. Thermal conductivity of silicon and germanium from 3 K to the melting point. Phys. Rev. 134:1964;A1058-A1069.
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    • Glassbrenner, C.J.1    Slack, G.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.