Deep states in silicon on sapphire by transient-current spectroscopy

Journal of Applied Physics

Volumn 82, Issue 10, 1997, Pages 5262-5264

  Sadoh, T ^a   Matsushita, A ^a   Zhang, Y Q ^a   Bai, D J ^a   Baba, A ^a   Kenjo, A ^a   Tsurushima, T ^a   Mori, H ^a   Nakashima, H ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE CROSS SECTIONS; DENSITY DISTRIBUTIONS; RAMAN BACKSCATTERING SPECTROSCOPY; SILICON FILMS; SILICON ON SAPPHIRES;

METALLIC FILMS; SAPPHIRE;

SYSTEMS ENGINEERING;

EID: 0742276004     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366394     Document Type: Article

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