JFET/SOS devices: Processing and gamma radiation effects

International Conference on Solid-State and Integrated Circuit Technology Proceedings

Volumn , Issue , 1998, Pages 67-70

  Nie, Jiping ^a   Liu, Zhongli ^a   He, Zhijing ^a   Yu, Fang ^a   Li, Guohua ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; DIFFUSION IN SOLIDS; GAMMA RAYS; ION IMPLANTATION; IONIC CONDUCTION IN SOLIDS; LEAKAGE (FLUID); SILICON ON SAPPHIRE TECHNOLOGY; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

ENHANCEMENT/DEPLETION MODE TRANSISTORS;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 0032226888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)