X-ray absorption spectroscopy (NEXAFS) of polymer surfaces

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 89-92

  Unger, W E S ^a   Lippitz, A ^a   Woll Ch ^b   Heckmann, W ^c  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

^c BASF SE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000555519     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050352     Document Type: Article

References (11)

1. Stöhr J (1992) NEXAFS Spectroscopy, Springer Series in Surface Science, vol. 25. Springer, Berlin Heidelberg New York
2. Peterson H, Jung C, Hellwig C, Peatman WB, Gudat W (1995) Rev Sci Instrum 66:1
3. Beamson G, Briggs D (1992) High resolution XPS of organic polymers. Wiley, Chichester
4. th Annual MSA Meeting, Minneapolis, Minnesota, USA, pp 158
5. Research at BESSY. A User's Handbook, Ed. Jung Ch, BESSY 1993
6. Batson PE (1993) Phys Rev B 48:2608
7. Gross Th, Lippitz A, Unger WES, Friedrich JF, Wöll Ch (1994) Polymer 35:5590
8. Bagus PS, Weiss K, Schertel A, Wöll Ch, Braun W, Hellwig C, Jung C (1995) Chem Phys Lett 248:129
9. Lippitz A, Friedrich JF, Unger WES, Schertel A, Wöll Ch (1996) Polymer 14:3151
10. Pettersson LGM, Ågren H, Schürmann BL, Lippitz A, Unger WES (1996) J Quantum Chemistry (accepted)
11. Lippitz A, Koprinarov I, Friedrich JF, Unger WES, Weiss K, Wöll Ch (1996) Polymer 14:3157