Piezoelectric properties of CaBi4Ti4O15 ferroelectric thin films investigated by atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 5994-5997

  Fu, Desheng ^a   Suzuki, Kazuyuki ^a   Kato, Kazumi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscopy (AFM); Bismuth layer structured ferroelectric thin film; Ferroelectric; Piezoelectric

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CALCIUM COMPOUNDS; ELECTRODES; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; PIEZOELECTRICITY; POLARIZATION;

CALCIUM BISMUTH TITANATE; LANTHANUM TITANATE; POLAR AXIS;

FERROELECTRIC THIN FILMS;

EID: 0345171619     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5994     Document Type: Article

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