Observation of piezoelectric relaxation in ferroelectric thin films by continuous charge integration

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 9 B, 2001, Pages 5683-5686

  Fu, Desheng ^a   Ishikawa, Kenji ^a   Minakata, Makoto ^a   Suzuki, Hisao ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Charge integration; Ferroelectrics; Piezoelectric; PZT; Relaxation; Thin film

Indexed keywords

ELECTRIC CHARGE; ELECTRIC RESISTANCE; LEAKAGE CURRENTS; MAGNETIC DOMAINS; MAGNETIC RELAXATION; PIEZOELECTRIC MATERIALS; PIEZOELECTRICITY; POLARIZATION; STRESSES; TIME DOMAIN ANALYSIS;

PIEZOELECTRIC RELAXATIONS; STRESS-INDUCED POLARIZATIONS;

FERROELECTRIC THIN FILMS;

EID: 0035455022     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.5683     Document Type: Article

References (18)