Investigation of domain switching and retention in oriented PbZr 0.3Ti0.7O3 thin film by scanning force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 11 B, 2002, Pages 6724-6729

  Fu, Desheng ^a,b   Suzuki, Kazuyuki ^a   Kato, Kazumi ^a   Minakata, Makoto ^b   Suzuki, Hisao ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Domain; Ferroelectric; PZT; Retention; Scanning force microscopy; Switching; Thin film

Indexed keywords

MICROSCOPIC EXAMINATION; SWITCHING; ZIRCON;

DOMAIN; FERROELECTRIC; PZT; RETENTION; SCANNING FORCE MICROSCOPY;

THIN FILMS;

EID: 0344626589     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.6724     Document Type: Article

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