High-piezoelectric behavior of c-axis-oriented lead zirconate titanate thin films with composition near the morphotropic phase boundary

Applied Physics Letters

Volumn 80, Issue 19, 2002, Pages 3572-3574

  Fu, Desheng ^a   Suzuki, Hisao ^a   Ogawa, Takeshi ^a   Ishikawa, Kenji ^b  

^a SHIZUOKA UNIVERSITY   (Japan)

^b YOKKAICHI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD ZIRCONATE TITANATE THIN FILMS; MORPHOTROPIC PHASE BOUNDARIES; PIEZOELECTRIC RESPONSE; POLED FILMS; PZT; PZT FILM; SINGLE-CRYSTAL SUBSTRATES; STRESS-INDUCED; THIN-FILM DEPOSITION TECHNIQUE;

CERAMIC MATERIALS; LEAD; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; THIN FILMS; ZIRCONIUM;

VAPOR DEPOSITION;

EID: 79956007271     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1477619     Document Type: Article

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