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Volumn 12, Issue 2, 2003, Pages 185-192

Novel fabrication method for surface micromachined thin single-crystal silicon cantilever beams

Author keywords

Cantilever beam; Chemical mechanical polishing (CMP); Merged epitaxial lateral overgrowth; Silicon on insulator (SOI)

Indexed keywords

CHEMICAL MECHANICAL POLISHING; MICROMACHINING; NATURAL FREQUENCIES; SILICON; SILICON ON INSULATOR TECHNOLOGY; SINGLE CRYSTALS;

EID: 0344950324     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2003.809974     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.