Testability access of the high speed test features in the Alpha 21264 microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 487-495

  Bhavsar, Dilip K ^a   Akeson, David R ^a   Gowan, Michael K ^a   Jackson, Daniel B ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS; STANDARDS;

ON CHIP TESTABILITY ACCESS ARCHITECTURE;

INTEGRATED CIRCUIT TESTING;

EID: 0032306935     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)