Testability features of the MCF5407 containing the 4th generation coldfire microprocessor core

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 151-159

  McLaurin, Teresa L ^a   Frederick, Frank ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; DATA STORAGE EQUIPMENT; MICROPROCESSOR CHIPS; PHASE LOCKED LOOPS;

CONSISTENT METHODOLOGY; MICROPROCESSOR CORE;

DESIGN FOR TESTABILITY;

EID: 0034481914     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)