Fault tuples in diagnosis of deep-submicron circuits

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 233-241

  Blanton, R D Shawn ^a   Chen, J T ^a   Desineni, R ^a   Dwarakanath, K N ^a   Maly, W ^a   Vogels, T J ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Characterization; Diagnosis; Failure analysis; Fault model

Indexed keywords

DEFECTS; FAILURE ANALYSIS; LOGIC DESIGN; MATHEMATICAL MODELS; MICROELECTRONICS; POLYSILICON;

DEEP SUBMICRON CIRCUITS; FAULT MODEL; FAULT TUPLES; INTEGRATED CIRCUIT DEFECTS; POLYSILICON SPOT DEFECTS;

INTEGRATED CIRCUIT TESTING;

EID: 0036443193     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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