Using Logic Models to Predict the Detection Behavior of Statistical Timing Defects

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1041-1050

  Wang, Li C ^a   Krstic, Angela ^a   Lee, Leonard ^a   Cheng, Kwang Ting ^a   Mercer, M Ray ^b   Williams, T W ^c   Abadir, Magdy S ^c  

^a University of California   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ERROR DETECTION; FORMAL LOGIC; STATISTICAL METHODS;

TIMING DEFECTS;

TIMING CIRCUITS;

EID: 0142153667     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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