Path selection for delay testing of deep sub-micron devices using statistical performance sensitivity analysis

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 97-104

  Liou, Jing Jia ^a   Cheng, Kwang Ting ^a   Mukherjee, Deb Aditya ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

DELAY TESTING; SOFTWARE PACKAGE SPICE; STATISTICAL PERFORMANCE SENSITIVITY ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0033751554     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)