Single electron charging in Si nanocrystals embedded in silicon-rich oxide

Nanotechnology

Volumn 14, Issue 9, 2003, Pages 959-964

  Yu, Zhenrui ^a   Aceves, Mariano ^a   Carrillo, Jesus ^b   Flores, Francisco ^b  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; INTERFACES (MATERIALS); MOS CAPACITORS; SILICON; THIN FILMS;

CHARGE TRAPPING EFFECTS;

NANOSTRUCTURED MATERIALS;

EID: 0142007110     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/9/304     Document Type: Article

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