Test compaction in a parallel access scan environment

Proceedings of the Asian Test Symposium

Volumn , Issue , 1997, Pages 300-305

  Bhatia, Sandeep ^a   Varma, Prab ^a  

^a Duet Technologies Inc

Author keywords

[No Author keywords available]

Indexed keywords

PARALLEL ACCESS SCAN; TEST COMPACTION;

LOGIC CIRCUITS; RANDOM ACCESS STORAGE;

INTEGRATED CIRCUIT TESTING;

EID: 0031355488     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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