Scanning SQUID Microscopy for Die Level Fault Isolation

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 391-396

  Vallett, David P ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; CURRENT DENSITY; DIES; ELECTRIC FAULT CURRENTS; ELECTRONICS PACKAGING; FAILURE ANALYSIS; FAST FOURIER TRANSFORMS; LIQUID CRYSTALS; MAGNETIC FLUX; SCANNING ELECTRON MICROSCOPY;

PHOTON EMISSION MICROSCOPY (PEM); PHYSICAL FAULT ISOLATION (PFI);

SQUIDS;

EID: 0041966960     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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