HTS scanning SQUID microscopy of active circuits

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 4103-4106

  Fleet, E F ^a   Chatraphorn, S ^a   Wellstood, F C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); IMAGING SYSTEMS; MAGNETIC FIELDS; MICROSCOPIC EXAMINATION; NETWORKS (CIRCUITS); SCANNING; SQUIDS; YTTRIUM BARIUM COPPER OXIDES;

SCANNING SQUID MICROSCOPY; SEMICONDUCTOR CIRCUITS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032655210     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783928     Document Type: Article

References (6)

1. R. C. Black, Magnetic Microscopy Using a Superconducting Quantum Interference Device, Ph. D. dissertation, Univ. of Maryland, College Park, 1995.
2. T. S. Lee, E. Dantsker, and J. Clarke, "High-transition temperature SQUID microscope", Rev. Sei. Instrum., vol. 67, pp. 4208-4215, December 1996.
3. B. J. Roth, N. G. Sepulveda, J. P. Wikswo, Jr, "Using a magnetometer to image a two-dimensional current distribution", J. Appl. Phys. 65 (1), pp. 361-372, Jan. 1989.
4. See, for example, J. Clarke, "SQUID Fundamentals", in SQUID Sensors: Fundamentals, Fabrication and Applications, H. Weinstock, Ed., Kluwer Academic Publishers, pp. 1-62, 1996.
5. Transform, Fortner Research LLC, ©1992-96.
6. For a more detailed look at the system, see E. F, Fleet, S. Chatraphorn, F. C. Wellstood, S. M. Green, L. A. Knauss, "HTS Scanning SQUID Microscope Cooled by a Closed-Cycle Refrigerator", (1998) Applied Superconductivity Conference, Palm Desert, CA (Unpublished).