Integration of SQUID Microscopy into FA Flow

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2001, Pages 77-81

  Dias, Rajen ^a   Skoglund, Lars ^a   Wang, Zhiyong ^a   Smith, David ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS (FA) FLOW; FAULT ISOLATION; SCANNING SQUID MICROSCOPY;

DEFECTS; FOURIER TRANSFORMS; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; MICROSCOPES; NONDESTRUCTIVE EXAMINATION; SCANNING; SENSORS; SQUIDS; THROUGHPUT;

FAILURE ANALYSIS;

EID: 1542300728     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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2. Thermal and optical enhancements to liquid crystal hot spot detection methods: S. Ferrier, ISTFA 1997, 57-62 (1997)
3. HTS scanning SQUID microscopy of active circuits: E. F. Fleet, S. Chatraphorn, F. C. Wellstood, and L. A. Knauss, IEEE Transaction on Applied Superconductivity, 9, 4103-4106 (1999)
4. Detecting power shorts from front and backside of IC packages using scanning SQUID microscopy: L. A. Knauss, B. M. Frazier, H. M. Christen, S. D. Silliman, K. S. Harshavardhan, E. F. Fleet, F. C. Wellstood, M. Mahanpour, and A. Ghaemmaghami, ISTFA 1999, 11-16 (1999)
5. Scanning SQUID microscopy of integrated circuits: S. Chatraphorn, E. F. Fleet, F. C. Wellstood, L. A. Knauss, and T. M. Eiles, Applied Physics Letters, 76, 2304-2306 (2000)
6. th Intl. Reliability Physics Symp., 413-419 (2000)
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8. HTS scanning SQUID microscope cooled by a closed-Cycle refrigerator: E.F. Fleet, S. Chatraphorn, F.C. Wellstood, S.M. Greene, and L.A. Knauss, IEEE Transactions on Applied Superconductivity, 9, 3704 (1999).