Determination of energy levels of surface states in GaAs metal-semiconductor field-effect transistor using deep-level transient spectroscopy

Applied Physics Letters

Volumn 74, Issue 8, 1999, Pages 1108-1110

  Choi, Kyoung Jin ^a   Lee, Jong Lam ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001455870     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123458     Document Type: Article

References (9)

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