Direct measurement of surface defect level distribution associated with GaAs antiphase boundaries

Physical Review Letters

Volumn 82, Issue 3, 1999, Pages 612-615

  Xu, Q ^a   Hsu, J W P ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 17944386830     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.82.612     Document Type: Article

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