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Volumn , Issue , 1996, Pages 81-88
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Electrical parameter data analysis and object-oriented techniques in semiconductor process development
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Cent
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER AIDED NETWORK ANALYSIS;
COMPUTER SIMULATION;
CURRENT VOLTAGE CHARACTERISTICS;
DATA PROCESSING;
DATA REDUCTION;
DATABASE SYSTEMS;
ELECTRIC NETWORK ANALYSIS;
INTEGRATING CIRCUITS;
OBJECT ORIENTED PROGRAMMING;
ONLINE SYSTEMS;
SEMICONDUCTOR DEVICE MODELS;
ADVANCED SEMICONDUCTOR TECHNOLOGY CENTER (ASTC);
INTEGRATED CIRCUIT TESTING;
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EID: 0030386405
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (9)
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