Estimation methods for quality factors of inductors fabricated in silicon integrated circuit process technologies

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 8, 1998, Pages 1249-1252

  Kenneth, O ^a  

^a University of Florida   (United States)

Author keywords

Integrated inductors; Quality factor; Silicon IC's

Indexed keywords

FREQUENCY RESPONSE; INTEGRATED CIRCUITS; PARAMETER ESTIMATION; QUALITY ASSURANCE; SEMICONDUCTING SILICON;

QUALITY FACTOR;

ELECTRIC INDUCTORS;

EID: 0032139494     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.705364     Document Type: Article

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