Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 4, 1998, Pages 582-591

  Pfost, Martin ^a,b   Rein, Hans Martin ^a,b,c,d  

^a IEEE   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

^d AEG   (Canada)

Author keywords

High speed circuit design; On chip crosstalk; Substrate coupling

Indexed keywords

EID: 0001431369     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.663563     Document Type: Article

References (22)

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