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Volumn 49, Issue 8, 2003, Pages 2099-2113

Feedback control of growth rate and surface roughness in thin film growth

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FEEDBACK CONTROL; MATHEMATICAL MODELS; MICROSTRUCTURE; MONTE CARLO METHODS; MULTIVARIABLE CONTROL SYSTEMS; SURFACE ROUGHNESS;

EID: 0038068807     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690490818     Document Type: Article
Times cited : (71)

References (32)
  • 1
    • 0036606109 scopus 로고    scopus 로고
    • Macro- and micro-scale simulation of growth rate and composition in MOCVD of yttria-stabilized zirconia
    • Akiyama, Y., N. Imaishi, Y. S. Shin, and S. C. Jung, "Macro- and Micro-scale Simulation of Growth Rate and Composition in MOCVD of Yttria-Stabilized Zirconia," J. Crystal Growth, 241:352-362 (2002).
    • (2002) J Crystal Growth , vol.241 , pp. 352-362
    • Akiyama, Y.1    Imaishi, N.2    Shin, Y.S.3    Jung, S.C.4
  • 2
    • 0029779089 scopus 로고    scopus 로고
    • Kinetic of submonolayer and multilayer epitaxial growth
    • Amar, J. G., and F. Family, "Kinetic of Submonolayer and Multilayer Epitaxial Growth," Thin Solid Films, 272, 208 (1996).
    • (1996) Thin Solid Films , vol.272 , pp. 208
    • Amar, J.G.1    Family, F.2
  • 3
    • 0033167354 scopus 로고    scopus 로고
    • Plasma-enhanced chemical vapor deposition: Modeling and control
    • Armaou, A., and P. D. Christofides, "Plasma-Enhanced Chemical Vapor Deposition: Modeling and Control," Chem. Eng. Sci., 54, 3305 (1999).
    • (1999) Chem. Eng. Sci. , vol.54 , pp. 3305
    • Armaou, A.1    Christofides, P.D.2
  • 4
    • 0042447758 scopus 로고    scopus 로고
    • Time-steppers and control of microscopic distributed processes
    • paper 257a, Indianapolis, IN
    • Armaou, A., C. L. Siettas, and I. G. Kevrekidis, "Time-Steppers and Control of Microscopic Distributed Processes," AIChE Meeting, paper 257a, Indianapolis, IN (2002).
    • (2002) AIChE Meeting
    • Armaou, A.1    Siettas, C.L.2    Kevrekidis, I.G.3
  • 5
    • 0033231203 scopus 로고    scopus 로고
    • Output feedback control of parabolic PDE systems with nonlinear spatial differential operators
    • Baker, J., and P. D. Christofides, "Output Feedback Control of Parabolic PDE Systems with Nonlinear Spatial Differential Operators," Ind. Eng. Chem. Res., 38, 4372 (1999).
    • (1999) Ind. Eng. Chem. Res. , vol.38 , pp. 4372
    • Baker, J.1    Christofides, P.D.2
  • 10
    • 0031191538 scopus 로고    scopus 로고
    • An ultrahigh vacuum high speed scanning tunneling microscope
    • Curtis, R., T. Mitsui, and E. Ganz, "An Ultrahigh Vacuum High Speed Scanning Tunneling Microscope," Rev. Sci. Instrum., 68, 2790 (1997).
    • (1997) Rev. Sci. Instrum. , vol.68 , pp. 2790
    • Curtis, R.1    Mitsui, T.2    Ganz, E.3
  • 11
    • 36448998595 scopus 로고
    • Theoretical foundations of dynamical Monte Carlo simulations
    • Fichthorn, K. A., and W. H. Weinberg, "Theoretical Foundations of Dynamical Monte Carlo Simulations," J. Chem. Phys., 95 1090 (1991).
    • (1991) J. Chem. Phys. , vol.95 , pp. 1090
    • Fichthorn, K.A.1    Weinberg, W.H.2
  • 12
    • 0027549695 scopus 로고
    • Single wafer processing in stagnation point flow CVD reactor: Prospects, constraints and reactor design
    • Gadgil, P. N., "Single Wafer Processing in Stagnation Point Flow CVD Reactor: Prospects, Constraints and Reactor Design," J. Electron. Mat., 22, 171 (1993).
    • (1993) J. Electron. Mat. , vol.22 , pp. 171
    • Gadgil, P.N.1
  • 13
    • 0038407172 scopus 로고    scopus 로고
    • Model reduction and system identification of master equation contrl systems
    • Denver, CO
    • Gallivan, M. A., and R. M. Murray," Model Reduction and System Identification of Master Equation Contrl Systems," Proc. of American Control Conf., Denver, CO, 3561 (2003).
    • (2003) Proc. of American Control Conf. , pp. 3561
    • Gallivan, M.A.1    Murray, R.M.2
  • 14
    • 0015326437 scopus 로고
    • Simulation of crystal growth with surface diffusion
    • Gilmer, G. H., and P. Bennema, "Simulation of Crystal Growth with Surface Diffusion," J. Appl. Phys., 43, 1347 (1972).
    • (1972) J. Appl. Phys. , vol.43 , pp. 1347
    • Gilmer, G.H.1    Bennema, P.2
  • 15
    • 0027592541 scopus 로고
    • Thin films in the integrated circuit industry: Requirements and deposition methods
    • Granneman, E. H., "Thin Films in the Integrated Circuit Industry: Requirements and Deposition Methods," Thin Solid Films, 228, 1 (1993).
    • (1993) Thin Solid Films , vol.228 , pp. 1
    • Granneman, E.H.1
  • 16
    • 5244272475 scopus 로고
    • Dynamic Monte Carlo simulations of surface-rate processes
    • Kang, H. C., and W. H. Weinberg, "Dynamic Monte Carlo Simulations of Surface-Rate Processes," Acc. Chem. Res., 25, 253 (1992).
    • (1992) Acc. Chem. Res. , vol.25 , pp. 253
    • Kang, H.C.1    Weinberg, W.H.2
  • 17
    • 0034895077 scopus 로고    scopus 로고
    • Multiscale model for epitaxial growth of films: Growth mode transition
    • Lam, R., and D. G. Vlachos, "Multiscale Model for Epitaxial Growth of Films: Growth Mode Transition," Phys. Rev. B, 64, 035401 (2001).
    • (2001) Phys. Rev. B , vol.64 , pp. 035401
    • Lam, R.1    Vlachos, D.G.2
  • 18
    • 0032630286 scopus 로고    scopus 로고
    • 5 interface and its effects on electrical performance of alternating current thin-film electroluminescent devices
    • 5 Interface and its Effects on Electrical Performance of Alternating Current Thin-Film Electroluminescent Devices," IEEE Trans. Electron Devices, 46, 892 (1999).
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 892
    • Lee, Y.H.1    Kim, Y.S.2    Ju, B.K.3    Oh, M.H.4
  • 19
    • 0037962061 scopus 로고    scopus 로고
    • Estimation and control of surface roughness in thin film growth using kinetic Monte-Carlo models
    • Lou, Y., and P. D. Christofides, "Estimation and Control of Surface Roughness in Thin Film Growth using Kinetic Monte-Carlo Models," Chem. Eng. Sci., 58, 3115 (2003).
    • (2003) Chem. Eng. Sci. , vol.58 , pp. 3115
    • Lou, Y.1    Christofides, P.D.2
  • 21
    • 0035475958 scopus 로고    scopus 로고
    • Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces
    • Pickering, C., "Spectroscopic Ellipsometry for Monitoring and Control of Surfaces, Thin Layers and Interfaces," Surf. Interface Anal., 31, 927 (2001).
    • (2001) Surf. Interface Anal. , vol.31 , pp. 927
    • Pickering, C.1
  • 22
    • 0000291789 scopus 로고    scopus 로고
    • Low-dimensional approximations of multiscale epitaxial growth models for microstructure control of materials
    • Raimondeau, S., and D. G. Vlachos, "Low-Dimensional Approximations of Multiscale Epitaxial Growth Models for Microstructure Control of Materials," J. Comp. Phys., 160, 564 (2000).
    • (2000) J. Comp. Phys. , vol.160 , pp. 564
    • Raimondeau, S.1    Vlachos, D.G.2
  • 23
    • 0035841075 scopus 로고    scopus 로고
    • Monte Carlo algorithms for complex surface reaction mechanisms: Efficiency and accuracy
    • Reese, J. S., S. Raimondeau, and D. G. Vlachos, "Monte Carlo Algorithms for Complex Surface Reaction Mechanisms: Efficiency and Accuracy," J. Comp. Phys., 173, 302 (2001).
    • (2001) J. Comp. Phys. , vol.173 , pp. 302
    • Reese, J.S.1    Raimondeau, S.2    Vlachos, D.G.3
  • 24
    • 4243347632 scopus 로고
    • Theory of self-diffusion at and growth of Al (111)
    • Stumpf, R., and M. Scheffler, "Theory of Self-Diffusion at and Growth of Al (111)," Phys. Rev. Lett., 72, 254 (1994).
    • (1994) Phys. Rev. Lett. , vol.72 , pp. 254
    • Stumpf, R.1    Scheffler, M.2
  • 25
    • 0033078356 scopus 로고    scopus 로고
    • Inverse model based real-time control for temperature uniformity of RTCVD
    • Theodoropoulou, A., R. A. Adomaitis, and E. Zafiriou, "Inverse Model Based Real-Time Control for Temperature Uniformity of RTCVD," IEEE Trans. Sem. Manuf., 12, 87 (1999).
    • (1999) IEEE Trans. Sem. Manuf. , vol.12 , pp. 87
    • Theodoropoulou, A.1    Adomaitis, R.A.2    Zafiriou, E.3
  • 27
    • 0031275154 scopus 로고    scopus 로고
    • Multiscale integration hybrid algorithms for homogeneous-heterogeneous reactors
    • Vlachos, D. G., "Multiscale Integration Hybrid Algorithms for Homogeneous-Heterogeneous Reactors," AIChE J., 43, 3031 (1997).
    • (1997) AIChE J. , vol.43 , pp. 3031
    • Vlachos, D.G.1
  • 28
    • 0001263467 scopus 로고
    • Kinetics of faceting of crystals in growth, etching, and equilibrium
    • Vlachos, D. G., L. D. Schmidt, and R. Aris, "Kinetics of Faceting of Crystals in Growth, Etching, and Equilibrium," Phys. Rev. B, 47, 4896 (1993).
    • (1993) Phys. Rev. B , vol.47 , pp. 4896
    • Vlachos, D.G.1    Schmidt, L.D.2    Aris, R.3
  • 29
    • 0035449005 scopus 로고    scopus 로고
    • Fundamental processes in Si/Si and Ge/Si studied by scanning tunneling microscopy during growth
    • Voigtländer, B., "Fundamental Processes in Si/Si and Ge/Si Studied by Scanning Tunneling Microscopy during Growth," Surf. Sci. Reports, 43, 127 (2001).
    • (2001) Surf. Sci. Reports , vol.43 , pp. 127
    • Voigtländer, B.1
  • 30
    • 0036502470 scopus 로고    scopus 로고
    • High-k gate dielectric materials
    • Wallace, R. M., and G. D. Wilk, "High-k Gate Dielectric Materials," MRS Bull., 3, 192 (2002).
    • (2002) MRS Bull. , vol.3 , pp. 192
    • Wallace, R.M.1    Wilk, G.D.2
  • 31
    • 0035794374 scopus 로고    scopus 로고
    • Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films
    • Zapien, J. A., R. Messier, and R. W. Collin, "Ultraviolet-Extended Real-Time Spectroscopic Ellipsometry for Characterization of Phase Evolution in BN Thin Films," Appl. Phys. Lett., 78, 1982 (2001).
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 1982
    • Zapien, J.A.1    Messier, R.2    Collin, R.W.3
  • 32
    • 0000175360 scopus 로고
    • Kinetic phase transitions in an irreversible surface-reaction model
    • Ziff, R. M., E. Gulari, and Y. Barshad, "Kinetic Phase Transitions in an Irreversible Surface-Reaction Model," Phy. Rev. Lett., 56, 2553 (1986).
    • (1986) Phy. Rev. Lett. , vol.56 , pp. 2553
    • Ziff, R.M.1    Gulari, E.2    Barshad, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.