Roughness of zns: prce/ta2o5 interface and its effects on electrical performance of alternating current thin-film electroluminescent devices

IEEE Transactions on Electron Devices

Volumn 46, Issue 5, 1999, Pages 892-896

  Lee, Yun Hi ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

2o5 tfel; Electroluminescence; Insulator; Interface ta; Zns

Indexed keywords

CAPACITANCE; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; INTERFACES (MATERIALS); LEAKAGE CURRENTS; OPTOELECTRONIC DEVICES; PHOSPHORS; SURFACE ROUGHNESS; TANTALUM COMPOUNDS; THIN FILM DEVICES; ZINC SULFIDE;

ALTERNATING CURRENT THIN-FILM ELECTROLUMINESCENT (ACTFEL) DEVICES; TANTALUM PENTOXIDE;

LUMINESCENT DEVICES;

EID: 0032630286     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.760394     Document Type: Article

References (10)

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