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Volumn 24, Issue 3, 2003, Pages 153-155

Wide range work function modulation of binary alloys for MOSFET application

Author keywords

Alloy; Metal gate; Work function

Indexed keywords

BINARY ALLOYS; ELECTRODES; HAFNIUM COMPOUNDS; INTERFACES (MATERIALS); METALLIC FILMS; PHOSPHORUS; PHOTORESISTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICA; SILICON WAFERS; THERMAL STRESS; THERMODYNAMIC STABILITY;

EID: 0037938629     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.809528     Document Type: Letter
Times cited : (124)

References (19)
  • 3
    • 0031140867 scopus 로고    scopus 로고
    • Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFETs
    • May
    • S. H. Lo, D. A. Buchanan, Y. Taur, and W. Wang, "Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFETs," IEEE Electron Device Lett., vol. 18, pp. 209-211, May 1997.
    • (1997) IEEE Electron Device Lett. , vol.18 , pp. 209-211
    • Lo, S.H.1    Buchanan, D.A.2    Taur, Y.3    Wang, W.4
  • 9
    • 0036160670 scopus 로고    scopus 로고
    • An adjustable work function technology using Mo gate for CMOS devices
    • Jan.
    • R. Lin, Q. Lu, P. Ranade, T. J. King, and C. Hu, "An adjustable work function technology using Mo gate for CMOS devices," IEEE Electron Device Lett., vol. 23, pp. 49-51, Jan. 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , pp. 49-51
    • Lin, R.1    Lu, Q.2    Ranade, P.3    King, T.J.4    Hu, C.5
  • 10
    • 0035714288 scopus 로고    scopus 로고
    • Properties of Ru-Ta alloys as gate electrodes for NMOS and PMOS silicon devices
    • H. Zhong, S. N. Hong, Y. S. Suh, H. Lazar, G. Heuss, and V. Misra, "Properties of Ru-Ta alloys as gate electrodes for NMOS and PMOS silicon devices," in IEDM Tech. Dig., 2001, pp. 432-435.
    • (2001) IEDM Tech. Dig. , pp. 432-435
    • Zhong, H.1    Hong, S.N.2    Suh, Y.S.3    Lazar, H.4    Heuss, G.5    Misra, V.6
  • 12
    • 0036540912 scopus 로고    scopus 로고
    • Dual work function metal gate CMOS transistors by Ni-Ti interdiffusion
    • Apr.
    • I. Polishchuk, P. Ranade, T. J. King, and C. Hu, "Dual work function metal gate CMOS transistors by Ni-Ti interdiffusion," IEEE Electron Device Lett., vol. 23, pp. 200-202, Apr. 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , pp. 200-202
    • Polishchuk, I.1    Ranade, P.2    King, T.J.3    Hu, C.4
  • 13
    • 0037260482 scopus 로고    scopus 로고
    • Investigation of Cu/TaNx metal gate for metal-oxide-silicon devices
    • Jan.; to be published
    • B. Y. Tsui and C. F. Huang, "Investigation of Cu/TaNx metal gate for metal-oxide-silicon devices," J. Electrochem. Soc., Jan. 2003, to be published.
    • (2003) J. Electrochem. Soc.
    • Tsui, B.Y.1    Huang, C.F.2
  • 14
    • 34547417516 scopus 로고
    • Charge transfer in alloys: AgAu
    • C. D. Gelatt, Jr. and H. Ehrenreich, "Charge transfer in alloys: AgAu," Phys. Rev. B, vol. 10, no. 2, pp. 398-415, 1974.
    • (1974) Phys. Rev. B , vol.10 , Issue.2 , pp. 398-415
    • Gelatt C.D., Jr.1    Ehrenreich, H.2
  • 17
    • 0034453428 scopus 로고    scopus 로고
    • Gate length scaling and threshold voltage control of double-gate MOSFETs
    • L. Chang, S. Tang, T. J. King, J. Bokor, and C. Hu, "Gate length scaling and threshold voltage control of double-gate MOSFETs," in IEDM Tech. Dig., 2000, pp. 719-722.
    • (2000) IEDM Tech. Dig. , pp. 719-722
    • Chang, L.1    Tang, S.2    King, T.J.3    Bokor, J.4    Hu, C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.