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Volumn 171, Issue 1-3, 2003, Pages 267-272
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Effect of N-containing additive gases on global warming gas emission during remote plasma cleaning process of silicon nitride PECVD chamber using C4F8/O2/Ar chemistry
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Author keywords
C4F8; Global warming effect; Remote plasma chamber cleaning; Silicon nitride
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Indexed keywords
GAS EMISSIONS;
GLOBAL WARMING;
OPTIMIZATION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASMA THEORY;
SURFACES;
PLASMA CLEANING;
SILICON NITRIDE;
CLEANING;
GLOBAL WARMING;
PLASMA TREATMENT;
SILICON NITRIDE;
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EID: 0037706762
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(03)00284-6 Document Type: Article |
Times cited : (19)
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References (14)
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