메뉴 건너뛰기




Volumn 171, Issue 1-3, 2003, Pages 267-272

Effect of N-containing additive gases on global warming gas emission during remote plasma cleaning process of silicon nitride PECVD chamber using C4F8/O2/Ar chemistry

Author keywords

C4F8; Global warming effect; Remote plasma chamber cleaning; Silicon nitride

Indexed keywords

GAS EMISSIONS; GLOBAL WARMING; OPTIMIZATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PLASMA THEORY; SURFACES;

EID: 0037706762     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00284-6     Document Type: Article
Times cited : (19)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.